Depth-resolved strain measurements by energy-variable X-ray diffraction

Nanostructure by high-energy X-ray diffraction

X-Ray Diffraction (XRD) has long been used to determine the atomic-scale structure of materials. This technique is based on the fact that the wavelength of X-rays is comparable to the distances between atoms in condensed matter. When a material exhibiting a long-range (i.e. at least micrometers), periodic atomic order, such as a crystal, is irradiated with X-rays it acts as an extended, well-de...

Excited-state structure by time-resolved X-ray diffraction.

X-ray crystallography has traditionally been limited to the study of the ground-state structure of molecules and solids. Recent technical advances are removing this limitation as demonstrated here by a time-resolved stroboscopic study of the photo-induced 50 micros lifetime excited triplet state of the [Pt(2)(pop)(4)](4-)ion [pop = pyrophosphate, (H(2)P(2)O(5))(2-)], performed at helium tempera...

Ultrafast structural changes measured by time-resolved X-ray diffraction

High-intensity X-ray pulses from third-generation synchrotron sources make it possible to study the temporal dynamics of rapidly evolving materials. We report a study of rapid and reversible disordering of the structure of an InSb crystal induced by an ultrashort laser pulse. A novel crosscorrelation detection technique is described, which allowed us to observe rapid changes in X-ray diffractio...

Thermomechanical strain measurements by synchrotron x-ray diffraction and data interpretation for through-silicon vias

THERMAL STRAIN MEASUREMENTS IN EPITAXIAL CoSi2/Si BY DOUBLE CRYSTAL X-RAY DIFFRACTION

The perpendicular x-ray strain of epitaxial CoSi2 films grown on Si(lll) substrates at ""' 600°C by MBE was measured at various temperatures. Within experimental error margins, the strain decreases linearly with rising temperature at a rate of (1.3±0.1) x lo-s ;oc from room temperature up to 600°C. Over that temperature range and the duration of a complete measurement (""' .5h to ""' 2h), these...